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ATEC-CONTAu-10 5X Stability: Thanks to its simple

SKU: 21473880728

4.5
EUR768.70 EUR814.70

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Ships within 48 hours · Estimated delivery Aug 2 - Aug 7

Description

Stability: Thanks to its simple and durable construction

Enables the use of Hitachi 15 and 25mm mounts with M4 thread on JEOL SEMs (including JEOL NEOSCOPE)

Thickness of Nickel grids is typically 35µm ±5µm

It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging

*Uses average data measured for each production wafer

ATEC-CONTAu-10 5X Stability: Thanks to its simpleDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for contact mode, detector and tip side: Au coating

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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