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FastScan-C probes are designed specifically for imaging in fluid on the Dimension FastScan AFM
and 47 x 27mm)
The pattern is fabricated using 30nm CrO2 over 40nm Cr on quartz
FESEM & FIB systems
Multi Holder for 8 pin stubs
All-In-One-Al-Tipless Tempfix™ FastScan-C probes are designed specificallyTipless AFM Probe with 4 Different Cantilevers for Various Applications DESCRIPTION CANTILEVER SPECIFICATIONS Tipless AFM Probe with 4 Different Cantilevers for Various Applications Versatile monolithic silicon AFM probe with 4 different tipless cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping non contact mode. The AFM holder chip fits most commercial
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