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Cross-Sectional Sample Holder DESCRIPTION
education and studies of properties of single crystal films
low carbon stainless steel coated with a solvent-based liquid PTFE coating formulated with special blends of fluoropolymers and other high performance resins to improve toughness and abrasion resistance
Specifications
Hard Magnetic
ElectriMulti75-G Select Quantity:10 per set Cross-Sectional Sample Holder DESCRIPTIONElectrical, Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample
