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25mm and 38mm width for glass knife makers or hand breaking
one flat metal set nipping along a parallel score line
150: Pitch 169µm
The basic reference specimen is calibrated by the National Physical Laboratory (counter part of NIST)
Width x Thickness 5114 CF
KPFM & EFM Sample Topcon 25mm and 38mm width forSample with Al and Au line arrays for KPFM and EFM tests DESCRIPTION Sample with Al and Au line arrays for KPFM and EFM tests Sample for KPFM and EFM tests featuring: arrays with alternating Al and Au lines deposited on an oxide covered silicon substrate line array pitches of 4, 8, 20 and 40 micrometers line height of approx. 35 nanometers chip mounted on a 15 millimeter glass disc metal disc stack thin silver plated copper wires connected to the Al
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