Pay in 4 interest-free payments of $55.85 Learn more
Ships within 48 hours · Estimated delivery Aug 2 - Aug 7
Can also be used to safely store FIB grids with thin section (lamellae) attached to them
Little outgassing under vacuum
We offer two retainer & mounting options
Available on 5x5mm silicon wafer chips
Scanning Capacitance Microscopy (SCM)
ContGD-G Select Quantity:50 per set Can also be used toGold Coated Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. AFM Tip
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