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This particular material choice prevents "binding" of parts in the SEM stage
Many types of samples can be mounted directly onto the Silicon Test Specimen so that an internal calibration is obtained in the image
This sample shown domains when imaged in SCM mode
A variety pack of tipless calibration levers with three different spring constants
EDS/WDS and electro polishing applications
ATEC-FMAu-10 ESD Safe This particular material choice preventsDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for force modulation mode, detector and tip side: Au coating
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