Pay in 4 interest-free payments of $266.44 Learn more
Ships within 48 hours · Estimated delivery Aug 3 - Aug 8
EDGEEC-V2-POT-100V
Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm
Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air
Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Set Back( RNG): 5 - 15
Contact resistance is typically 10 k
DDLTESP-V2 Unmounted EDGEEC-V2-POT-100VDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Brukers new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images. In electrical applications, these
